18 lines
1.5 KiB
BibTeX
18 lines
1.5 KiB
BibTeX
@ARTICLE{jtag,
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journal={IEEE Std 1149.1-2001},
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title={IEEE Standard Test Access Port and Boundary Scan Architecture},
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year={2001},
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month={July},
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pages={1-212},
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keywords={BSDL;Boundary-Scan Description Language;JTAG;TAP;VHDL;VHSIC Hardware Description Language;boundary scan;boundary-scan architecture;boundary-scan register;circuit boards;circuitry;integrated circuit;printed circuit boards;test;test access port},
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doi={10.1109/IEEESTD.2001.92950},}
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@ARTICLE{posix,
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journal={IEEE Std 1003.1, 2004 Edition},
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title={IEEE Standard for Information Technology - Portable Operating System Interface (POSIX(R)) - Base Definitions},
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year={2004},
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pages={1-3760},
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keywords={IEEE standards;Unix;application program interfaces;information technology;software portability;software standards;C-language header definitions;IEEE standard;POSIX/sup /spl reg//;UNIX Specification;applications portability;base definitions;command interpreter;common utility programs;information technology;portable operating system interface;source code level;IEEE standards;Information technology;Software portability;Software standards;CPU;FIFO;X/Open System Interface (XSI;application program interface (API);argument;asynchronous;basic regular expression (BRE);batch job;batch system;built-in utility;byte;child;command language interpreter;extended regular expression (ERE);file access control mechanism;input/output (I/O);job control;network;parent;portable operating system interface (POSIX);shell;stream;string;synchronous;system;thread},
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doi={10.1109/IEEESTD.2004.94570},
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month={April},}
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