9 lines
450 B
BibTeX
9 lines
450 B
BibTeX
@ARTICLE{jtag,
|
|
journal={IEEE Std 1149.1-2001},
|
|
title={IEEE Standard Test Access Port and Boundary Scan Architecture},
|
|
year={2001},
|
|
month={July},
|
|
pages={1-212},
|
|
keywords={BSDL;Boundary-Scan Description Language;JTAG;TAP;VHDL;VHSIC Hardware Description Language;boundary scan;boundary-scan architecture;boundary-scan register;circuit boards;circuitry;integrated circuit;printed circuit boards;test;test access port},
|
|
doi={10.1109/IEEESTD.2001.92950},}
|