@ARTICLE{jtag,
journal={IEEE Std 1149.1-2001},
title={IEEE Standard Test Access Port and Boundary Scan Architecture},
year={2001},
month={July},
pages={1-212},
keywords={BSDL;Boundary-Scan Description Language;JTAG;TAP;VHDL;VHSIC Hardware Description Language;boundary scan;boundary-scan architecture;boundary-scan register;circuit boards;circuitry;integrated circuit;printed circuit boards;test;test access port},
doi={10.1109/IEEESTD.2001.92950},}